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On an rpi3, this test takes close to 900MB of memory, and when it's run in parallel with another memory heavy test (such as itself in another configuration), it gets OOM-killed. It's unclear to me at this stage: - if such a memory footprint is expected of the test - whether the test could be modified to take less memory while still testing what we want Depending on the answers to this question, we might have to skip the test for memory limited devices.
Yeah, that seems pretty high. I'd guess we can cut down the memory usage somewhere, likely every object or something is retained while the test is running and that might not be needed.
*** This bug has been marked as a duplicate of bug 213321 ***